Wide-Bandgap (SiC & GaN) Dynamic Testing Solution

Double Pulse Testing Power Supplies: Engineering Guide for High dv/dt Bus Systems

High-voltage programmable DC power supplies from 1.5 kW to 10 MW with low-capacitance options, current-fed protection, and fast transient recovery designed for SiC & GaN switching characterization.

Engineered for Extreme Switching Dynamics

Double Pulse Testing demands precise voltage stability, minimal output capacitance interaction, and robust immunity against high dv/dt & di/dt noise spikes.

10 kW / 1UHighest power density
0Max DC output voltage
< 10 msFast dynamic response
4–6 weeksTypical lead time
100%Short-circuit immunity
Information Gain & Architectural Insights

Why Standard Voltage-Source DC Supplies Fail in Double Pulse Testing Rigs

Double Pulse Testing (DPT) is the industry-standard method for evaluating the dynamic switching characteristics ($E_{on}, E_{off}, Q_{rr}, t_d, t_r, t_f$) of wide-bandgap (WBG) Silicon Carbide (SiC) MOSFETs and Gallium Nitride (GaN) HEMTs under realistic operational stresses.

The Physics of Double Pulse Testing & The DC Bus Challenge

In a standard Double Pulse Test circuit, a high-voltage DC power supply charges an external low-inductance bus capacitor bank ($C_{bus}$). The device under test (DUT) is turned on for a precise first pulse ($t_1$) to charge an inductive load to the target test current ($I_{test}$). After a short off-time, a second turn-on pulse ($t_2$) measures turn-on energy loss ($E_{on}$) and reverse recovery characteristics ($Q_{rr}$) of the complementary freewheeling diode or body diode under maximum switching stress.

During these sub-microsecond switching transitions, transition rates routinely exceed $\text{dv/dt} > 100\,\text{V/ns}$ and $\text{di/dt} > 10\,\text{A/ns}$. Conventional voltage-source programmable DC supplies suffer from severe limitations in this environment:

  • Excessive Internal Output Capacitance ($C_{out}$): Standard power supplies place large electrolytic or film capacitor banks directly across their output terminals to suppress output ripple. During a high-voltage breakdown or transient shoot-through event in a DUT, this stored energy ($\frac{1}{2} C_{out} V^2$) dumps directly into the semiconductor die, causing catastrophic failure and preventing failure mode diagnosis.
  • Voltage Ringing and Resonance: The interaction between the power supply's output filter stage, long interconnect cables, and the low-ESR local decoupling bus ($C_{bus}$) can excite parasitic resonance, causing severe voltage instability on the high-voltage DC rail during double-pulse bursts.
  • High dv/dt Noise Injection into Feedback Loops: Extreme voltage slew rates generated by SiC/GaN devices feed common-mode noise back into the power supply's voltage regulation circuit via parasitic capacitance to ground, causing latch-up, false trip shutdowns, or controller instability.
  • Lack of Reverse Blocking Isolation: Inductive kickbacks during hard turn-off can force reverse current back into the supply terminals. Without integrated blocking diodes (+BD option), back-EMF spikes can damage the internal rectifier bridge or output filters.
Topological Differentiation

Magna-Power Current-Fed Power Conversion vs. Conventional Voltage-Fed Topologies

Understanding the inner power architecture is critical for test system designers specifying DC bus supplies for SiC/GaN dynamic test stations.

Current-Fed Topology Icon

Current-Fed Topology (Magna-Power Standard)

Magna-Power utilizes a proprietary current-fed power architecture featuring a high-frequency energy-storage inductor placed upstream of the primary inverter bridge. This inductor acts as a natural current limiter, making the power supply inherently immune to sudden short circuits, DUT arc-overs, and extreme transient step loads.

Low Output Capacitance Icon

Low Stored Energy Output Filter (+HS Option)

By leveraging high-frequency switching and current-fed control loops, Magna-Power drastically reduces required output capacitance. The optional High Slew Rate (+HS) configuration further removes output capacitors, lowering stored output energy by up to 90% and enabling sub-millisecond dynamic voltage stepping.

Blocking Diode Protection Icon

Integrated Reverse Blocking Diode (+BD Option)

To isolate the DC bus supply from inductive back-EMF and high dv/dt voltage reflections generated during device turn-off, Magna-Power integrates factory-configured series blocking diodes (+BD option) built directly into the chassis assembly.

Robust Digital Interface Icon

Isolated Controls & LXI Automation

Fully isolated digital and analog control cards shield the internal Microchip DSP core from high-voltage common-mode transients. standard Ethernet/LXI, USB, and RS-232 support SCPI automated scripting with zero latency during automated ATE test sweeps.

Product Selection Guide

Recommended Double Pulse Testing Power Supplies & Electronic Loads

Explore Magna-Power’s programmable DC platforms optimized for wide-bandgap device characterization, module qualification, and traction inverter R&D.

SLx Series — High-Density 1U Programmable DC Power Supplies

The SLx Series delivers 1.5 kW to 10 kW of power in an ultra-compact 1U rack-mount enclosure. Featuring voltage ratings up to 1500 Vdc, the SLx is the premier choice for benchtop double-pulse test setups and automated test equipment (ATE) racks where space is at a premium.

1.5 kW – 10 kW1U Rack-Mount Up to 1500 VdcLow Output Capacitance (+HS)
SLx Series 1U DC Power Supply configured for double pulse testing

XR Series — Rugged 2U Universal DC Power Supplies

Offering generous thermal headroom and enhanced isolation, the XR Series spans 2 kW to 10 kW in 2U packaging with voltage configurations up to 1000 Vdc. Its conservative magnetics design makes it highly resilient against reflective EMI generated by fast-switching 1200V SiC modules.

2 kW – 10 kW2U Rack-Mount Enhanced IsolationUp to 1000 Vdc
MagnaDC XR and TS Series Power Supplies

TS Series — Mid to High Power Rack-Mount DC Supplies

Scaling from 5 kW to 100 kW across 3U to 16U chassis options, TS Series units provide the high current capacity needed for testing multi-chip power modules (MCPMs) and automotive traction inverter phase legs up to 4000 Vdc.

5 kW – 100 kW3U – 16U Rack-Mount Up to 4000 VdcMaster/Slave Paralleling
MagnaDC TS Series High Power DC Supply

ALx Series — Linear MOSFET DC Electronic Loads

When characterising power converter stages feeding dynamic loads, the ALx Series offers active sinking from 1.25 kW to 20 kW using a pure linear MOSFET architecture. Zero switching noise ensures clean oscilloscope measurements during sensitive gate-charge ($Q_g$) and parasitics evaluation.

1.25 kW – 20 kW+Linear MOSFET Stage Zero Switching NoiseCC / CV / CR / CP Modes
MagnaLOAD ALx Series Electronic Loads
Engineering Matrix

Double Pulse Testing Power Supplies: Parameter Matrix

Compare key operational parameters for selecting the optimum MagnaDC power supply configuration for your high-voltage DC bus test bench.

Series Power Range Max Voltage Cooling Output Cap (+HS) Short-Circuit Immunity Primary DPT Application
SLx 1.5 kW – 10 kW 1500 Vdc Air Cooled Ultra-Low (< 10% std) 100% Current-Fed Protected Benchtop SiC/GaN Discrete & Module DPT Rig
SL 1.5 kW – 10 kW 1000 Vdc Air Cooled Low Stored Energy 100% Current-Fed Protected Space-constrained ATE dynamic test bays
XR 2 kW – 10 kW 1000 Vdc Air Cooled Low Stored Energy 100% Current-Fed Protected Universal WBG lab power & long-term burn-in
TS 5 kW – 100 kW 4000 Vdc Air Cooled Reduced Energy Option 100% Current-Fed Protected EV Traction Inverter & High-Current Module DPT
MT 150 kW – 3 MW 4000 Vdc Air Cooled Custom Configuration 100% Current-Fed Protected Megawatt Grid-tie & Wind Tunnel Arc Testing
ML 500 kW – 10 MW 4000 Vdc Water Cooled Custom Configuration 100% Current-Fed Protected Solid-State Transformer (SST) & High-Power DPT

Note: All models support the optional +BD (Blocking Diode) and +HS (High Slew Rate) options specifically designed to maximize safety and measurement fidelity during high dv/dt switching transients.

Future Procurement Trends

Global semiconductor manufacturers, automotive OEMs, and aerospace research facilities are evolving their test infrastructure to keep pace with rapid wide-bandgap innovation.

1. Transition to 800V / 1200V+ EV & Grid Voltages

Automotive powertrains are transitioning from standard 400V battery architectures to 800V and 1200V systems. This shifts device requirements to 1200V, 1700V, and 3.3kV SiC MOSFETs, requiring DC bus power supplies capable of providing ultra-stable, ripple-free voltages up to 2000 Vdc and beyond with extremely low parasitic capacitive coupling.

2. Automated Double Pulse Test (ADPT) & AI Integration

Modern testing workflows rely on automated ATE suites controlled via Python, LabVIEW, or MATLAB. AI-driven test software requires programmable DC power supplies with fast SCPI command execution, deterministic Ethernet/LXI interfaces, and zero latency when cycling through multi-variable test matrices ($V_{ds}, I_d, T_j$).

3. High dv/dt Noise Immunity & Optical Isolation

As switching speeds exceed $150\,\text{V/ns}$, electromagnetic interference (EMI) forces test engineers to isolate measurement hardware. Power supplies for DPT must feature galvanic control isolation and low chassis-to-output capacitance to prevent ground-loop noise corruption during switching transitions.

4. Device Short-Circuit & Ruggedness Characterization

Testing non-clamped inductive loads (UIL) and short-circuit withstand times ($t_{sc}$) frequently leads to explosive device failure. Test labs require DC supplies with current-fed topologies that instantly limit fault energy, protecting expensive probe cards, gate drivers, and neighboring hardware.

5. Multi-Megawatt Solid-State Transformer (SST) Qualification

Grid-level power conversion and renewable energy storage rely on high-power medium-voltage SiC modules. Procurement teams are specifying scalable, liquid-cooled DC power supplies capable of delivering megawatt-level bus power with parallel control synchronization.

6. Supply Chain Resilience & Domestic Manufacturing Compliance

Global procurement directors prioritize suppliers with vertically integrated manufacturing to eliminate geopolitical supply chain bottlenecks. In-house control over sheet metal, magnetics, and surface-mount technology ensures predictable 4-6 week delivery schedules.

Flag of the United States of America

Vertically Integrated USA Quality & World-Class Engineering

Since 1981, Magna-Power Electronics has designed and built robust programmable DC power supplies and electronic loads at its state-of-the-art facility in Flemington, New Jersey. Vertically integrated manufacturing provides full authority over quality, performance, and lead times.

  • In-house CNC machining, custom magnetics winding, and automated SMT PCB assembly
  • 100% full-power burn-in and rigorous NIST-traceable calibration on every instrument
  • Patented current-fed power topology delivering unmatched immunity against output faults
  • Global support footprint spanning North America, Europe, UK, Australia, and Asia
Proven Field Reliability

Engineered for Technical Excellence

Leading research institutes, semiconductor manufacturers, and defense contractors rely on Magna-Power DC bus supplies for critical power testing.

  • Current-Fed Arc & Fault Tolerance

    Inductive DC bus storage limits prospective short-circuit currents naturally, ensuring the power supply survives DUT breakdown events unscathed.

  • Low Output Stored Energy (+HS)

    The optional High Slew Rate (+HS) configuration slashes internal output capacitance, keeping energy discharge during a device fault below destructive thresholds.

  • Integrated Isolation & Blocking Options

    Chassis blocking diodes (+BD) shield the power supply output stage from high dv/dt reflections and inductive flyback energy generated by hard switching transients.

Lockheed Martin logo
“To do what Magna-Power does with one power supply, we would have needed three from the other guys. On top of that, Magna-Power was less expensive, so the bang for buck and size was excellent.”
Paul K.Lockheed Martin
QinetiQ logo
“Below is the scope capture from the XR connected directly in place of the previous supply. We were amazed. I am impressed with the build quality of the unit — chalk one up for Made in the USA.”
Tom S.QinetiQ
University of Houston logo
“High quality products from Magna-Power. I have worked with other manufacturers and faced different problems such as EMI noise, but no problem with Magna-Power.”
Amin S.University of Houston
01 / 03
Technical Knowledgebase

Frequently Asked Questions: Double Pulse Testing Power Supplies

Answers to common AI and buyer queries regarding power supply selection, topology performance, and circuit isolation for dynamic semiconductor characterization.

Why is low internal output capacitance ($C_{out}$) essential for Double Pulse Testing DC bus supplies?
During Double Pulse Testing, high-voltage switching transitions generate extreme $\text{dv/dt}$ slew rates. If the power supply has excessive internal output capacitance, it stores significant energy ($\frac{1}{2} C_{out} V^2$). In the event of a DUT insulation breakdown, gate oxide failure, or shoot-through, this entire stored energy discharges instantaneously through the semiconductor die, incinerating the device and rendering failure analysis impossible. Magna-Power’s High Slew Rate (+HS) option minimizes internal output capacitance by replacing large electrolytic output filter banks with ultra-low capacitance designs, allowing external local decoupling capacitors ($C_{bus}$) to safely manage pulse currents while preventing catastrophic DUT destruction.
How does Magna-Power’s Current-Fed topology protect against short circuits during device breakdown?
Unlike traditional Voltage-Fed power supplies that act as stiff voltage sources backed by large capacitive energy reservoirs, Magna-Power’s Current-Fed architecture feeds the primary converter bridge through an energy-storage inductor. If a device under test shorts out or arcs over during a double-pulse sequence, the inductor naturally chokes the rate of current rise ($\text{di/dt} = \frac{V}{L}$). The internal DSP detects the overcurrent condition and turns off the inverter switches before high current levels can damage the supply or test fixture.
What optional configurations are recommended when ordering a MagnaDC supply for Double Pulse Testing?
For Double Pulse Testing applications, Magna-Power application engineers strongly recommend two key options:
1. High Slew Rate Option (+HS): Slashing internal output capacitance to achieve sub-millisecond voltage response times and minimal stored fault energy.
2. Blocking Diode Option (+BD): Integrating a high-voltage series power diode at the supply terminals to prevent back-EMF spikes, reverse current flow, and inductive ringing from entering the power supply.
Can MagnaDC power supplies be integrated into automated ATE test software (Python, LabVIEW, MATLAB)?
Yes. MagnaDC power supplies come standard with Ethernet/LXI, USB, and RS-232 interfaces running standard SCPI syntax. Magna-Power provides fully documented National Instruments LabVIEW VI drivers, IVI drivers, and Python example scripts. Automated test software can set voltage limits, execute automated voltage step sweeps across multi-variable matrix runs, and monitor telemetry in real time.
How do I calculate the required local DC bus capacitance ($C_{bus}$) versus the power supply current rating?
The primary role of the DC power supply during DPT is to recharge the local low-inductance bus capacitor bank ($C_{bus}$) between pulse bursts, while $C_{bus}$ supplies the instantaneous high-pulse current ($I_{test}$) during the double-pulse sequence. The minimum required DC bus capacitance is calculated based on allowable voltage droop ($\Delta V$):
$$\Delta V = \frac{I_{test} \cdot t_{pulse}}{C_{bus}}$$ The DC power supply current rating must be sized to recharge $C_{bus}$ back to nominal operating voltage ($V_{bus}$) within the repetitive test cycle period ($T_{cycle}$). Our application engineering team can assist in modeling your exact pulse profile.
What is the typical lead time for custom-configured Double Pulse Testing Power Supplies?
Thanks to Magna-Power’s vertically integrated manufacturing facility in Flemington, New Jersey, typical build times for made-to-order programmable DC power supplies range from 4 to 6 weeks. Common stock units are also maintained for urgent lab requirements.
How does high dv/dt noise immunity differ between air-cooled and water-cooled power supplies?
Both air-cooled (SLx, XR, TS, MT) and water-cooled (ML) MagnaDC series utilize fully isolated digital control boards and shielded feedback transformers to withstand high common-mode voltage spikes ($\text{dv/dt} > 100\,\text{V/ns}$). Water-cooled ML Series models provide additional environmental sealing and acoustic isolation for continuous high-power dynamic testing environments.

Optimize Your Double Pulse Testing Infrastructure

Consult with a Magna-Power application engineer to select the ideal DC voltage rating, current capacity, low-capacitance (+HS) options, and blocking diode (+BD) protection for your SiC and GaN dynamic test bench.

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